Test & Inspection

SEHO SelectLine no background2

SEHO SelectLine-C at S.E.E. Stockholm

SEHO Systems GmbH will highlight the SelectLine-C at the S.E.E. Scandinavian Electronic Event, scheduled to take place April 24-26, 2018 at the Kista Expo Center in Sweden.
YXLON Cheetah EVO

NPI Award for Cheetah EVO PLUS

YXLON International Receives NPI Award for Its Cheetah EVO PLUS Scalable X-ray Inspection System for Laboratory Applications.
Nordson DAGE Quadra 3

Quadra 3: a Maintenance-Free X-ray Inspection System

Nordson DAGE welcomes a new member to its family of X-ray inspection systems. Quadra 3 is specifically designed for high-quality X-ray inspection in PCBA production applications.
FX-942

YESTECH’s FX-942 dual sided AOI system at APEX 2018

Nordson YESTECH will conduct live demonstrations of their complete line of AOI and Conformal Coating systems (FX-942) in booth #2120 at APEX
CyberOptics APSRQ

Yield-Improving Wireless Measurement Devices for Semiconductor Tools (AMSR)

CyberOptics Corporation presents ReticleSense Auto Multi Sensors (AMSR) at SPIE Advanced Lithography at the San Jose Convention Center
VT-X750

Omron’s High-speed Inspection with Computed Tomography (CT)

Omron's High-speed Inspection with Computed Tomography (CT)

Orbotech Revolutionizes the AOI Room with 4-in-1 AOI Solution

Orbotech’s new Ultra Dimension Series reduces the total cost of ownership of the PCB AOI room by integrating leading pattern inspection, laser via inspection, Remote Multi-Image Verification (RMIV) and 2D metrology into a single AOI solution

A new In-Line Dual Sided AOI System by Nordson YESTECH

Nordson YESTECH launched their latest innovation, the FX-942UV ACI In-Line Dual Sided Optical Inspection System for PCB conformal coating and parts, at the productronica exhibition.
FLIR_ETS320

FLIR: Thermal Imaging Camera for Electronics Development and Testing

RS Components launches FLIR ETS320 Thermal Imaging Camera for Electronics Development and Testing
MIRTECMV-6OMNI

Best Rated Cost, Flexibility & Technology

MIRTEC exhibits its MV-6 OMNI 3D AOI System in Hall A2, Booth 329 at productronica.

Nordson DAGE: Test and Inspection Systems at SEMICON West

Nordson DAGE: Test and Inspection Systems at SEMICON West

Scienscope Receives Third Respected Award for Its Automated Component Counters

Scienscope Receives Third Respected Award for Its Automated Component Counters

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