Test & Inspection

SI Analysis Techniques for Automotive Ethernet Applications by Cadence

A top-down analysis methodology is a good strategy to design interfaces efficiently automotive Ethernet interfaces. An example from Cadence expert.

Seica-Mentor Jointly-Developed Test Programming Solution

Seica and Mentor announce a new release of their integrated test programming solution for high-mix PCB manufacturing   Seica, a supplier of automated test equipment for...
MRS-Enabled SQ3000

CyberOptics and the New MRS-Enabled SQ3000 for AOI, SPI and CMM

CyberOptics Will Demonstrate MRS-Enabled SQ3000 for AOI, SPI and CMM at electronica 2018
Yxlon ECO-Pair

Yxlon: Big Cats in Electronics Production

At this year’s Nepcon Thailand (June 20–23), Yxlon launched their Cheetah and Cougar ECO X-ray inspection systems for use in the electronics industry.
Cyberoptics SQ3000

A Lot of Applications for MRS-Enabled SQ3000 Platform

CyberOptics Corporation will demonstrate the MRS-Enabled SQ3000 with multi-process capabilities at SMT 2018 at Nuremberg Messe
Test for Battery Array

Robotic solution for Battery Test Field by Acculogic

With the patented Battery Array Tester by Acculogic, a method has been developed to test the connections of several batteries
SEHO SelectLine no background2

SEHO SelectLine-C at S.E.E. Stockholm

SEHO Systems GmbH will highlight the SelectLine-C at the S.E.E. Scandinavian Electronic Event, scheduled to take place April 24-26, 2018 at the Kista Expo Center in Sweden.

NPI Award for Cheetah EVO PLUS

YXLON International Receives NPI Award for Its Cheetah EVO PLUS Scalable X-ray Inspection System for Laboratory Applications.
Nordson DAGE Quadra 3

Quadra 3: a Maintenance-Free X-ray Inspection System

Nordson DAGE welcomes a new member to its family of X-ray inspection systems. Quadra 3 is specifically designed for high-quality X-ray inspection in PCBA production applications.

YESTECH’s FX-942 dual sided AOI system at APEX 2018

Nordson YESTECH will conduct live demonstrations of their complete line of AOI and Conformal Coating systems (FX-942) in booth #2120 at APEX
CyberOptics APSRQ

Yield-Improving Wireless Measurement Devices for Semiconductor Tools (AMSR)

CyberOptics Corporation presents ReticleSense Auto Multi Sensors (AMSR) at SPIE Advanced Lithography at the San Jose Convention Center

Omron’s High-speed Inspection with Computed Tomography (CT)

Omron's High-speed Inspection with Computed Tomography (CT)

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